A Silicon Element Quality Inspection System Based on YOLOv8
Published in Proceedings of the International Conference on Machine Learning, Pattern Recognition and Automation Engineering. Pages 29 – 35., 2024
This paper is about the number 3. The number 4 is left for future work.
Recommended citation: Your Name, You. (2015). “Paper Title Number 3.” Journal 1. 1(3).
Recommended citation: Bole Zhang.(2024)"A Silicon Element Quality Inspection System Based on YOLOv8 " Proceedings of the International Conference on Machine Learning, Pattern Recognition and Automation Engineering.; https://doi.org/10.1145/3696687.3696693 Journal 2. 1(2).
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